发明名称 SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TEST METHOD
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which stable power source voltage can be supplied to whole chips and a manufacturing cost is reduced. SOLUTION: In a semiconductor integrated circuit provided with a function circuit and a power source circuit 2 supplying at least one kind of power source voltage to the function circuit through a power source wiring 6, the power source wiring consists of metal wirings arranged in a mesh state on the function circuit, and a resistance element 1 connecting an output section of at least one kind of power source voltage out of power source voltage and corresponding power source wirings, is included.
申请公布号 JP2002208275(A) 申请公布日期 2002.07.26
申请号 JP20010003877 申请日期 2001.01.11
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 KONDO MASATAKA;OTA KIYOTO;HIROSE MASANOBU;YAMAZAKI HIROYUKI
分类号 G11C11/407;G11C29/00;G11C29/56;H01L21/82;H01L21/822;H01L27/04;H02J1/00 主分类号 G11C11/407
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