发明名称 |
SEMICONDUCTOR INTEGRATED CIRCUIT AND ITS TEST METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor integrated circuit in which stable power source voltage can be supplied to whole chips and a manufacturing cost is reduced. SOLUTION: In a semiconductor integrated circuit provided with a function circuit and a power source circuit 2 supplying at least one kind of power source voltage to the function circuit through a power source wiring 6, the power source wiring consists of metal wirings arranged in a mesh state on the function circuit, and a resistance element 1 connecting an output section of at least one kind of power source voltage out of power source voltage and corresponding power source wirings, is included. |
申请公布号 |
JP2002208275(A) |
申请公布日期 |
2002.07.26 |
申请号 |
JP20010003877 |
申请日期 |
2001.01.11 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KONDO MASATAKA;OTA KIYOTO;HIROSE MASANOBU;YAMAZAKI HIROYUKI |
分类号 |
G11C11/407;G11C29/00;G11C29/56;H01L21/82;H01L21/822;H01L27/04;H02J1/00 |
主分类号 |
G11C11/407 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|