| 摘要 |
<p>PROBLEM TO BE SOLVED: To generate a test pattern in a good efficiency for verifying a logic circuit having a specific state transition without taking a man-hour at a logically verifying time of a long time according to many types of data packets. SOLUTION: A test pattern generator stores a plurality of data packet definition data for defining the data packets (hereinafter referred to as a 'packet'), stores a plurality of definitions of a macro command for ordering the packet defined by the data packet definition data or ordering a plurality of predetermined contents of the packets in a macro library 4, stores a sending sequence data having a plurality of identifiers for identifying the packets and a plurality of the macro commands in a sending sequence data storage unit 3, inputs the sending sequence data by a data packet generating unit 1, and generates the identifier indicated in the input step or the packet indicated by the macro command based on the data packet definition data or the definition of the macro command.</p> |
