发明名称 ALIGNER AND METHOD OF EXPOSURE
摘要 <p>PROBLEM TO BE SOLVED: To increase the exposure accuracy and suppress the increase in size of an aligner. SOLUTION: With an object W being moved along the movement surface by driving a stage WST using a driver 11, an exposure beam irradiates the object W to transfer a specified pattern onto the object W. During the exposure, a counter stage (22, etc.), moves in the opposite direction from the stage according to the movement of the stage, so reaction force caused by the driving of the stage is almost completely absorbed. Consequently, there is no vibration nor unbalanced load caused attendant upon the driving of the stage, leading to a very accurate exposure. When the exposure beam is not irradiated, the position of the counter stage is properly corrected so that a movement stroke of the counter stage for the exposure thereafter can be obtained by means of a correction device (45A1, etc.), and thereby the stroke length required for the counter stage can be shortened. Thus, the increase in size of the equipment can be suppressed.</p>
申请公布号 JP2002208562(A) 申请公布日期 2002.07.26
申请号 JP20010342735 申请日期 2001.11.08
申请人 NIKON CORP 发明人 TANAKA KEIICHI;BINNARD MIKE
分类号 G03F7/22;G03B27/62;G03F7/20;H01L21/027;H01L21/68;(IPC1-7):H01L21/027 主分类号 G03F7/22
代理机构 代理人
主权项
地址