发明名称 SUBSTRATE FOR TESTING BONDING STRENGTH
摘要 PROBLEM TO BE SOLVED: To provide a substrate for testing bonding strength with which bonding tests can be evaluated accurately. SOLUTION: This substrate for testing bonding strength has a die bonding region and a lead-side wire bonding area. The die bonding region to which a die to be measured is bonded is formed in a recessed section.
申请公布号 JP2002208617(A) 申请公布日期 2002.07.26
申请号 JP20010004015 申请日期 2001.01.11
申请人 OKI ELECTRIC IND CO LTD 发明人 KAI YASUJI
分类号 H01L21/60;H01L21/52 主分类号 H01L21/60
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