发明名称 LIGHT EMISSION DEVICE
摘要 PROBLEM TO BE SOLVED: To prevent a pixel part from generating cracks by relaxing thermal stress. SOLUTION: On the upper layer of a thin film transistor used for an active matrix light emitting device, the third insulation layer made of silicon nitride or silicon nitric oxide is formed together with a positive electrode, an organic compound layer, and a negative electrode containing alkali metal between the fourth insulation layer, made of carbon as a main component and the third insulation layer. The light emitting element is formed between reverse tapered shaped separation walls made of insulation material.
申请公布号 JP2002208477(A) 申请公布日期 2002.07.26
申请号 JP20010345439 申请日期 2001.11.09
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 YAMAZAKI SHUNPEI;ARAI YASUYUKI
分类号 H05B33/04;G09F9/30;H01L27/32;H01L51/50;H05B33/10;H05B33/14;H05B33/22;(IPC1-7):H05B33/04 主分类号 H05B33/04
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