发明名称 Resist resins, chemically amplified resist composition, and process for the formation of a pattern
摘要 A resist resin has a molecular structure in which protecting groups bond to a base resin such that elimination of the protecting groups from the resist resin increases its alkali-solubility. The protecting groups are residual groups represented by the following formula (I): represents a substituted or unsubstituted, fused ring having 12 to 25 carbon atoms, and R represents an alkyl group having 1 to 4 carbon atoms. The resist resin is excellent in etch resistance, resist resolution and substrate adhesion and also in various other properties required for resist resins.
申请公布号 US2002098442(A1) 申请公布日期 2002.07.25
申请号 US20010991691 申请日期 2001.11.26
申请人 NEC CORPORATION 发明人 YAMANA MITSUHARU
分类号 G03F7/004;C08F220/28;C08K5/00;C08L33/00;G03F7/039;H01L21/027;(IPC1-7):G03F7/004 主分类号 G03F7/004
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