发明名称 Non-invasive brain function examination
摘要 By combining various indexes concerning brain functions, still more highly accurate brain function examination is achieved. An apparatus for examining the subject's brain functions acquires two or more indexes of pupillary indexes that show subject's pupillary characteristics, visual indexes that show subject's visual system functions, intelligence evaluating indexes that are results of the intelligence test carried out on the subject, and behavior evaluating indexes that show the results of subject's behavior examination. Two or more indexes are stored in the memory and outputted from the output unit. By combining two or more kinds of independent indexes, accurate determination of dementia cases and further the degree of senescence of brain functions can be achieved. In addition, the brain function examining apparatus put together a number of a plurality of indexes by the multivariate calculation and converts into different values of fewer numbers. Thus, brain functions can be examined simply and easily.
申请公布号 US2002099305(A1) 申请公布日期 2002.07.25
申请号 US20010026646 申请日期 2001.12.27
申请人 MATSUSHITA ELECTIC WORKS, LTD. 发明人 FUKUSHIMA SHOGO;MURAKAMI SHUJI;SUZUKI KENSHI;NAKAJIMA RYOJI
分类号 A61B3/06;A61B3/08;A61B3/11;A61B3/113;A61B5/00;A61B5/16;(IPC1-7):A61B5/00 主分类号 A61B3/06
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