发明名称 Structure and method for fabricating GaN devices utilizing the formation of a compliant substrate
摘要 High quality epitaxial layers of GaN can be grown overlying large silicon wafers (200) by forming an amorphous layer (210) on the substrate. The amorphous layer dissipates strain and permits the growth of a high quality GaN layer (208). Any lattice mismatch between the GaN layer and the underlying substrate is taken care of by the amorphous layer.
申请公布号 US2002096683(A1) 申请公布日期 2002.07.25
申请号 US20010766046 申请日期 2001.01.19
申请人 MOTOROLA, INC. 发明人 RAMDANI JAMAL;HILT LYNDEE L.
分类号 H01L21/20;H01L21/316;H01L21/318;H01L33/00;(IPC1-7):H01L31/025;H01L23/58 主分类号 H01L21/20
代理机构 代理人
主权项
地址