发明名称 |
APPARATUS FOR MEASURING THE CONTOUR OF A SURFACE |
摘要 |
An apparatus (20) for measuring the contour of a surface, such as a wall, comprises a fixed base (30), and a laser (40) for projecting a laser beam along a laser projection axis. The laser beam is operatively pivotally mounted on the fixed base for pivotal movement about a main axis oriented perpendicularly to the laser projection axis. A stepper motor (48) and computer algorithm determine the angle of orientation of the Laser projection axis with respect to a reference orientation, and cord means (60) operatively mounted at a secured end on the apparatus and projecting through a departure point concurrent with the main axis to terminate at a free end. A digital encoder (70) determines a projected length of cord extending between the departure point and the free end, which free end. A microprocessor (80) calculates the XY co-ordinates of each point on the surface, from each determined length of cord and the corresponding selected angular orientations of the laser projection axis. A method of measuring the contour of the surface is also disclosed. |
申请公布号 |
WO02057708(A2) |
申请公布日期 |
2002.07.25 |
申请号 |
WO2002CA00044 |
申请日期 |
2002.01.14 |
申请人 |
AXYZ INTERNATIONAL INC.;ZEUNER, ALFRED, N.;VARONA, PAUL, P. |
发明人 |
ZEUNER, ALFRED, N.;VARONA, PAUL, P. |
分类号 |
G01B5/004;G01C15/00 |
主分类号 |
G01B5/004 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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