发明名称 APPARATUS FOR MEASURING THE CONTOUR OF A SURFACE
摘要 An apparatus (20) for measuring the contour of a surface, such as a wall, comprises a fixed base (30), and a laser (40) for projecting a laser beam along a laser projection axis. The laser beam is operatively pivotally mounted on the fixed base for pivotal movement about a main axis oriented perpendicularly to the laser projection axis. A stepper motor (48) and computer algorithm determine the angle of orientation of the Laser projection axis with respect to a reference orientation, and cord means (60) operatively mounted at a secured end on the apparatus and projecting through a departure point concurrent with the main axis to terminate at a free end. A digital encoder (70) determines a projected length of cord extending between the departure point and the free end, which free end. A microprocessor (80) calculates the XY co-ordinates of each point on the surface, from each determined length of cord and the corresponding selected angular orientations of the laser projection axis. A method of measuring the contour of the surface is also disclosed.
申请公布号 WO02057708(A2) 申请公布日期 2002.07.25
申请号 WO2002CA00044 申请日期 2002.01.14
申请人 AXYZ INTERNATIONAL INC.;ZEUNER, ALFRED, N.;VARONA, PAUL, P. 发明人 ZEUNER, ALFRED, N.;VARONA, PAUL, P.
分类号 G01B5/004;G01C15/00 主分类号 G01B5/004
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