发明名称 |
Manufacturing method of a semiconductor device |
摘要 |
In the formation of a P-type rediffusion region adjacent to a source drain region in an N well, boron fluoride is implanted without a P well covered with a mask. And in the formation of an N-type rediffusion region adjacent to a source drain region in a P well, phosphorus is implanted with an N well covered with a mask. The dose of boron fluoride implanted without a mask is smaller than the dose of phosphorus.
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申请公布号 |
US2002098663(A1) |
申请公布日期 |
2002.07.25 |
申请号 |
US20020106063 |
申请日期 |
2002.03.27 |
申请人 |
KABUSHIKI KAISHA TOSHIBA |
发明人 |
MIYAMOTO KOJI;INOUE KOHTARO |
分类号 |
H01L21/28;H01L21/8238;H01L27/092;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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