发明名称 Manufacturing method of a semiconductor device
摘要 In the formation of a P-type rediffusion region adjacent to a source drain region in an N well, boron fluoride is implanted without a P well covered with a mask. And in the formation of an N-type rediffusion region adjacent to a source drain region in a P well, phosphorus is implanted with an N well covered with a mask. The dose of boron fluoride implanted without a mask is smaller than the dose of phosphorus.
申请公布号 US2002098663(A1) 申请公布日期 2002.07.25
申请号 US20020106063 申请日期 2002.03.27
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 MIYAMOTO KOJI;INOUE KOHTARO
分类号 H01L21/28;H01L21/8238;H01L27/092;(IPC1-7):H01L21/76 主分类号 H01L21/28
代理机构 代理人
主权项
地址
您可能感兴趣的专利