发明名称 CHARACTERIZATION OF COMPLIANT STRUCTURE FORCE-DISPLACEMENT BEHAVIOUR
摘要 <p>An instrument for enabling a precise determination of the force-displacement characteristics of a compliant structure, including both in-plane and out-of-plane structure deflection, is provided by the invention. The instrument includes a fixture that is oriented for constraining an end of the compliant structure with respect to mechanical ground as the force-displacement characteristic is determined. A mechanical probe of the instrument is disposed relative to the fixture to enable pushing of the probe against a free end of the compliant structure. A mechanical stage is provided, including a support for the probe, and being free with respect to mechanical ground to advance the probe relative to the fixture. This enables pushing of the probe against the free end of the compliant structure. A reference element is connected to the stage, and a displacement transmission element is disposed relative to the mechanical probe and the compliant reference element to transmit deflection of the compliant structure, produced by pushing of the probe, to the compliant reference element. A displacement sensor is disposed relative to the displacement transmission element to measure displacement of the transmission element, and a displacement sensor is disposed relative to the mechanical stage to measure displacement of the mechanical stage. The compliant reference element and the displacement transmission element can be configured with respect to the constraining fixture to accommodate deflection of the compliant structure along more than one axis, e.g., along either of two deflection axes.</p>
申请公布号 WO2002057732(A2) 申请公布日期 2002.07.25
申请号 US2002004544 申请日期 2002.01.18
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