发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: To remove an SiO2 layer from the surface of a TiSi2 layer without doing damage to the TiSi2 layer 2. CONSTITUTION: This has a process of removing the SiO2 layer 7 made on a TiSi2 layer 6, using hydrogen fluoride gas, and a process of removing it, heating the TiFx , layer 8 made on the TiSi2 layer 6 made on the TiSi2 layer 6 at the time of removal of the SiO2 layer 7.
申请公布号 JPH08330248(A) 申请公布日期 1996.12.13
申请号 JP19960039272 申请日期 1996.02.27
申请人 TOSHIBA CORP 发明人 MURAOKA KOICHI;KUNISHIMA IWAO;NISHINO HIROTAKE
分类号 H01L21/28;H01L21/203;H01L21/205;H01L21/302;H01L21/3065;H01L21/311;H01L21/316;(IPC1-7):H01L21/28;H01L21/306 主分类号 H01L21/28
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