发明名称 BIT-LINE CONTACT AND FORMING METHOD THEREOF
摘要 PURPOSE: A bit-line contact and forming method thereof are provided to vertically twist the bitlines between two bitline levels, not causing a loss in area in the DRAM array. CONSTITUTION: A method of forming bitline contacts: forming gate conductor lines with a capping layer on a substrate(5); depositing an oxide layer over the capping layer; forming a bitline contact line mask over portions of the oxide layer; etching the bitline contact line mask to the capping layer and between the gate conductor lines stopping at the substrate; depositing a silicon layer on the substrate between the conductor lines and non etched portions of the oxide layer; depositing a bitline layer on the silicon layer; masking and etching portions of the bitline layer; and depositing metal over the silicon layer and on sides of non etched portions of the bitline layer to form left and right bitlines.
申请公布号 KR20020061499(A) 申请公布日期 2002.07.24
申请号 KR20020000577 申请日期 2002.01.05
申请人 INFINEON TECHNOLOGIES NORTH AMERICA CORPORATION;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BERGNER WOLFGANG;DIVAKARUNI RAMACHANDRA;FALTERMEIER JOHNATHAN E.;NESBIT LARRY A.
分类号 H01L21/768;H01L21/28;H01L21/60;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 主分类号 H01L21/768
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