发明名称 |
BIT-LINE CONTACT AND FORMING METHOD THEREOF |
摘要 |
PURPOSE: A bit-line contact and forming method thereof are provided to vertically twist the bitlines between two bitline levels, not causing a loss in area in the DRAM array. CONSTITUTION: A method of forming bitline contacts: forming gate conductor lines with a capping layer on a substrate(5); depositing an oxide layer over the capping layer; forming a bitline contact line mask over portions of the oxide layer; etching the bitline contact line mask to the capping layer and between the gate conductor lines stopping at the substrate; depositing a silicon layer on the substrate between the conductor lines and non etched portions of the oxide layer; depositing a bitline layer on the silicon layer; masking and etching portions of the bitline layer; and depositing metal over the silicon layer and on sides of non etched portions of the bitline layer to form left and right bitlines.
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申请公布号 |
KR20020061499(A) |
申请公布日期 |
2002.07.24 |
申请号 |
KR20020000577 |
申请日期 |
2002.01.05 |
申请人 |
INFINEON TECHNOLOGIES NORTH AMERICA CORPORATION;INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
BERGNER WOLFGANG;DIVAKARUNI RAMACHANDRA;FALTERMEIER JOHNATHAN E.;NESBIT LARRY A. |
分类号 |
H01L21/768;H01L21/28;H01L21/60;H01L21/8242;H01L27/108;(IPC1-7):H01L21/28 |
主分类号 |
H01L21/768 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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