发明名称 Method of fabricating deep trench capacitor
摘要 A method of fabricating a trench capacitor includes forming a trench in a substrate; forming a conductive diffusion region in the substrate surrounding a lower portion of the trench; forming a dielectric layer along an inner surface of the trench; and filling the trench with a first doped polysilicon layer. A first recess is formed to expose an upper portion of the inner sidewall of the trench. A collar dielectric layer is formed on the exposed inner sidewall. The first recess is filled with a second doped polysilicon layer. A second recess is formed to expose a part of the upper portion of the inner sidewall. A gap is formed between the exposed inner sidewall and the second doped polysilicon layer, and filled with a doped polysilicon layer converted from an undoped polysilicon layer.
申请公布号 US6423594(B1) 申请公布日期 2002.07.23
申请号 US20010754459 申请日期 2001.01.04
申请人 WINBOND ELECTRONICS CORP. 发明人 TSAI HONG-HSIANG;CHEN HSI-CHUAN
分类号 H01L27/108;H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L27/108
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