发明名称 |
Method of fabricating deep trench capacitor |
摘要 |
A method of fabricating a trench capacitor includes forming a trench in a substrate; forming a conductive diffusion region in the substrate surrounding a lower portion of the trench; forming a dielectric layer along an inner surface of the trench; and filling the trench with a first doped polysilicon layer. A first recess is formed to expose an upper portion of the inner sidewall of the trench. A collar dielectric layer is formed on the exposed inner sidewall. The first recess is filled with a second doped polysilicon layer. A second recess is formed to expose a part of the upper portion of the inner sidewall. A gap is formed between the exposed inner sidewall and the second doped polysilicon layer, and filled with a doped polysilicon layer converted from an undoped polysilicon layer.
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申请公布号 |
US6423594(B1) |
申请公布日期 |
2002.07.23 |
申请号 |
US20010754459 |
申请日期 |
2001.01.04 |
申请人 |
WINBOND ELECTRONICS CORP. |
发明人 |
TSAI HONG-HSIANG;CHEN HSI-CHUAN |
分类号 |
H01L27/108;H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L27/108 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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