发明名称 Particle-removing apparatus for a semiconductor device manufacturing apparatus and method of removing particles
摘要 In a semiconductor device manufacturing apparatus that processing a substrate by applying a voltage to a gas to create a plasma, positively charged particles are trapped or guided at the instant that the cathode voltage is stopped, by an electrode to which is imparted a negative voltage, so as to prevent particles reaching the substrate.
申请公布号 US6423176(B1) 申请公布日期 2002.07.23
申请号 US20000685351 申请日期 2000.10.10
申请人 NEC CORPORATION 发明人 ITO NATSUKO;UESUGI FUMIHIKO;MORIYA TSUYOSHI
分类号 H01J37/32;(IPC1-7):H05H1/00;C23C16/00 主分类号 H01J37/32
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