发明名称 Statistical process control system with normalized control charting
摘要 A method for monitoring the performance of a manufacturing entity is provided. Metrology data indicating an output parameter of the manufacturing entity is retrieved. The output parameter has an associated target value. The metrology data is normalized based on the target value to generate normalized performance data points. A performance rule violation is determined based on the normalized performance data. A manufacturing system includes a metrology tool, a first database, and a processor. The metrology tool is adapted to measure an output parameter of a manufacturing entity to generate metrology data. The output parameter has an associated target value. The first database is adapted to receive the metrology data. The processor is adapted to retrieve the metrology data from the database, normalize the metrology data based on the target value to generate normalized performance data points, and determine a performance rule violation based on the normalized performance data.
申请公布号 US6424876(B1) 申请公布日期 2002.07.23
申请号 US19990359988 申请日期 1999.07.22
申请人 ADVANCED MICRO DEVICES, INC. 发明人 CUSSON BRIAN K.;SHARIER JAMES;GIGUERE JUSTIN;OSHELSKI ANATASIA
分类号 G06F17/18;G06Q10/00;(IPC1-7):G06F19/00 主分类号 G06F17/18
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