Probe apparatus having removable beam probes

摘要

An apparatus for electronically testing of bound electrical circuits connected to planar arrayed pads having removable mounted conductive beam probes to simplify the manufacturing and maintaining process. A space transformer comprises from outside electrically accessible conductive holes wherein the guided beam probes are friction resilient resting. In a second embodiment, the friction resilient resting induces a predetermined bending onto the beam probes. This is accomplished by offsetting guiding plates thus imposing a rotational urging on the probe neck within the conductive hole which is just a bare extension of the beam probe.