| 摘要 |
A scanning microscope uses near-field evanescent electromagnetic waves emitted from a sharpened metal tip (20) to probe sample (80) properties. The sharpened tip (20), which is electrically and mechanically connected to a central electrode (18), extends through and beyond an aperture (22) in an endwall (16) of a microwave resonating device, such as a microwave cavity resonator (10). The microscope is capable of high resolution imaging and quantitative measurement of the electrical properties of a sample, such as the dielectric constant, tangent loss, conductivity, and complex electrical impedance measurements. |
