发明名称 Method for producing SOI wafers by delamination
摘要 This invention provides a method for producing SOI wafers by delamination comprising the steps of preparing a first wafer (2) having an insulating layer (3) on its both major surfaces; providing two delamination planes (4; 4') in the interior of said first wafer (2); bonding a second wafer (1) on one side of the first wafer (2); bonding a third wafer (1') on the other side of the first wafer (2); and delaminating said second and third wafers (1; 1') from said first wafer (2) such that each of said second and third wafers (1; 1') carries a SOI layer (3, 7; 3', 7') on one of its major surfaces.
申请公布号 US6420243(B1) 申请公布日期 2002.07.16
申请号 US20000729502 申请日期 2000.12.04
申请人 MOTOROLA, INC. 发明人 STANLEY TIMOTHY DARYL;STANLEY PETER
分类号 H01L21/20;H01L21/30;H01L21/46;H01L21/762;(IPC1-7):H01L21/30 主分类号 H01L21/20
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