发明名称 Modular substrate measurement system
摘要 Substrate measurement system including a measurement chamber (30), and a substrate handling chamber (7) possessing substrate transfer means (10) and a substrate container interface (1) arranged to receive a substrate container (8), the handling chamber (7) containing an interface (50) to connect the measurement chamber (30), the measurement chamber (30) containing an interface (51) to connect to the handling chamber (7), and the transfer means (10) being arranged to transfer substrates between the container (8) and the measurement chamber (30) through the handling chamber (7), in which a second measurement chamber (39) is provided, having the same interface (51) as the first measurement chamber (30) to replace the latter chamber (30).
申请公布号 US6420864(B1) 申请公布日期 2002.07.16
申请号 US20000548773 申请日期 2000.04.13
申请人 NANOPHOTONICS AG;RECIF SA 发明人 ABRAHAM MICHAEL;RAAIJMAKERS IVO J. M. M.;GAUDON ALAIN;ASTEGNO PIERRE
分类号 H01L21/00;(IPC1-7):G01R31/26 主分类号 H01L21/00
代理机构 代理人
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