发明名称 Multi probe unit and measuring apparatus comprising thereof
摘要 For the purpose of reducing noise entering from outside and cross talk to a practically negligible extent even when using covered conducting wire made of only conducting wires and insulators, a multi-probe unit has a plurality of probes for contact with a plurality of conductor patterns to be inspected which are aligned side by side, in which every two adjacent ones of the probes for contact with odd-numbered one and even-numbered one of the conductor patterns are positioned in upper and lower levels distant in the thickness direction, and a shield plate of a conductive material having an electrically shielding function is interposed between the upper and lower probes.
申请公布号 US6420889(B1) 申请公布日期 2002.07.16
申请号 US20000527846 申请日期 2000.03.17
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 TERADA SHIGEKI
分类号 G01R1/067;G01R1/073;G01R1/18;(IPC1-7):G01R31/02 主分类号 G01R1/067
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