发明名称 Three device DRAM cell with integrated capacitor and local interconnect
摘要 A semiconductor integrated circuit memory cell, including at least three transistors and a capacitor to form a DRAM. The memory cell is fabricated on a semiconductor substrate including impurity regions, and using two semiconductor films, with dielectric films between the semiconductor films. The capacitor contains two electrodes. A substrate impurity region forms one of the electrodes; the other electrode is a semiconductor film which connects the gate of one device to an impurity region of another. The method for manufacturing the above-described integrated circuit, which may be used for the manufacture of similar circuits, is also disclosed.
申请公布号 US6420746(B1) 申请公布日期 2002.07.16
申请号 US19980182857 申请日期 1998.10.29
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 BRACCHITTA JOHN A.;MANN RANDY W.;OPPOLD JEFFREY H.
分类号 H01L21/02;H01L21/768;H01L27/108;(IPC1-7):H01L27/108;H01L29/76;H01L31/119;H01L29/00 主分类号 H01L21/02
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