发明名称 |
METHOD OF MANUFACTURING SILICON CARBIDE SUBSTRATE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To manufacture a 3C-SiC single crystal reduced in generation of stacking fault with good reproducibility. SOLUTION: The method of manufacturing the SiC single crystal is as follows: after forming a plurality of line and space ups and downs on the Si substrate, performing epitaxial growth of a 1st 3C-SiC layer 21 on the surface of Si substrate 11; after removing Si substrate 11 from the 1st 3C-SiC layer 21, performing epitaxial growth of a 2nd 3C-SiC layer 22 on the exposed surface having ups and downs of the 1st 3C-SiC layer 21; flattening the surface.
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申请公布号 |
JP2002201098(A) |
申请公布日期 |
2002.07.16 |
申请号 |
JP20000401178 |
申请日期 |
2000.12.28 |
申请人 |
TOSHIBA CORP |
发明人 |
NISHIO JOJI;HACHIMAN AKIHIRO;SHINOHE TAKASHI |
分类号 |
C30B29/36;H01L21/205;(IPC1-7):C30B29/36 |
主分类号 |
C30B29/36 |
代理机构 |
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代理人 |
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地址 |
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