发明名称 METHOD OF MANUFACTURING SILICON CARBIDE SUBSTRATE AND METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To manufacture a 3C-SiC single crystal reduced in generation of stacking fault with good reproducibility. SOLUTION: The method of manufacturing the SiC single crystal is as follows: after forming a plurality of line and space ups and downs on the Si substrate, performing epitaxial growth of a 1st 3C-SiC layer 21 on the surface of Si substrate 11; after removing Si substrate 11 from the 1st 3C-SiC layer 21, performing epitaxial growth of a 2nd 3C-SiC layer 22 on the exposed surface having ups and downs of the 1st 3C-SiC layer 21; flattening the surface.
申请公布号 JP2002201098(A) 申请公布日期 2002.07.16
申请号 JP20000401178 申请日期 2000.12.28
申请人 TOSHIBA CORP 发明人 NISHIO JOJI;HACHIMAN AKIHIRO;SHINOHE TAKASHI
分类号 C30B29/36;H01L21/205;(IPC1-7):C30B29/36 主分类号 C30B29/36
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