发明名称 Semiconductor device and method of manufacturing the same
摘要 A field effect transistor occupying a small area and a semiconductor device using the same can be obtained. A gate electrode is provided on a substrate on which a source region is provided with a first interlayer insulating film interposed therebetween. The gate electrode is covered with a second interlayer insulating film. A contact hole for exposing a part of the surface of the source region is provided so as to penetrate through the first interlayer insulating film, the gate electrode, and the second interlayer insulating film. A sidewall surface of the contact hole is covered with a gate insulating film. A first semiconductor layer of a first conductivity type is provided on the surface of the source region in contact therewith up to the lower surface of the gate electrode. A channel semiconductor layer is provided on the surface of the first semiconductor layer up to the upper surface of the gate electrode. A second semiconductor layer of a first conductivity type serving as a drain region is provided on the channel semiconductor layer.
申请公布号 US6420751(B1) 申请公布日期 2002.07.16
申请号 US20000640880 申请日期 2000.08.18
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 MAEDA SHIGENOBU;YAMAGUCHI YASUO;KURIYAMA HIROTADA;MAEGAWA SHIGETO
分类号 H01L21/768;H01L21/8242;H01L27/092;H01L27/10;H01L27/108;H01L27/11;H01L27/12;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/768
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