发明名称 Efficient top-down characterization method
摘要 A method of efficiently characterizing modules of an integrated circuit (IC) design using a logic synthesis tool comprising the steps of defining a list of instances of the modules to characterize, and characterizing entire modules of said list of instances of the modules using a single invocation of characterize command of the logic synthesis tool.
申请公布号 US6421818(B1) 申请公布日期 2002.07.16
申请号 US19980027438 申请日期 1998.02.20
申请人 LSI LOGIC CORPORATION 发明人 DUPENLOUP GUY;CLEEREMAN KEVIN CHRISTOPHER
分类号 G06F17/50;(IPC1-7):G06F17/50 主分类号 G06F17/50
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