发明名称 BACKUP METHOD FOR SEMICONDUCTOR EQUIPMENT
摘要 PURPOSE: A backup method for semiconductor equipment is provided to perform a backup process for the semiconductor equipment by using a permanent dummy wafer. CONSTITUTION: A dummy wafer is loaded into a chamber installed within semiconductor equipment(S10). The dummy wafer is formed by metal material. A semiconductor fabrication process for the dummy wafer is performed(S12). The dummy wafer is unloaded from the semiconductor equipment after the semiconductor fabrication process for the dummy wafer is performed(S14). A backup process for the semiconductor equipment is checked after the dummy wafer is unloaded from the semiconductor equipment(S16). A chemical process for the dummy wafer is performed(S18) after the backup process for the semiconductor equipment is performed.
申请公布号 KR20020057752(A) 申请公布日期 2002.07.12
申请号 KR20010000824 申请日期 2001.01.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, CHEON YONG;LEE, TAE SUN
分类号 H01L21/00;(IPC1-7):H01L21/00 主分类号 H01L21/00
代理机构 代理人
主权项
地址