发明名称 |
BACKUP METHOD FOR SEMICONDUCTOR EQUIPMENT |
摘要 |
PURPOSE: A backup method for semiconductor equipment is provided to perform a backup process for the semiconductor equipment by using a permanent dummy wafer. CONSTITUTION: A dummy wafer is loaded into a chamber installed within semiconductor equipment(S10). The dummy wafer is formed by metal material. A semiconductor fabrication process for the dummy wafer is performed(S12). The dummy wafer is unloaded from the semiconductor equipment after the semiconductor fabrication process for the dummy wafer is performed(S14). A backup process for the semiconductor equipment is checked after the dummy wafer is unloaded from the semiconductor equipment(S16). A chemical process for the dummy wafer is performed(S18) after the backup process for the semiconductor equipment is performed.
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申请公布号 |
KR20020057752(A) |
申请公布日期 |
2002.07.12 |
申请号 |
KR20010000824 |
申请日期 |
2001.01.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, CHEON YONG;LEE, TAE SUN |
分类号 |
H01L21/00;(IPC1-7):H01L21/00 |
主分类号 |
H01L21/00 |
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