发明名称 |
METHOD FOR FABRICATING SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a semiconductor device is provided to stabilize a capacitor mask process by forming a photo-resist layer pattern on a wafer edge portion and performing the capacitor mask process. CONSTITUTION: An interlayer dielectric(10) is formed on a semiconductor substrate(1). A contact hole is formed on the semiconductor substrate(1). A contact plug(16) is formed by using a polysilicon or a selective-W. A core oxide layer(20) is formed on a whole surface of the above structure. The first photo-resist layer(34) is formed on the core oxide layer(20). The first photo-resist layer(34) is exposed selectively by using an anti-capacitor mask. The first photo-resist layer pattern(34) is formed by developing the first photo-resist layer(34). The second photo-resist layer(38) is applied on the whole surface. A charge storage electrode hole is formed by etching the exposed core oxide layer(20).
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申请公布号 |
KR20020058278(A) |
申请公布日期 |
2002.07.12 |
申请号 |
KR20000086340 |
申请日期 |
2000.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, CHAN SEOP;CHOI, SANG TAE;KO, BONG SANG;KWON, WON TAEK;SHIN, GI SU;YOON, TAE BONG |
分类号 |
H01L27/04;(IPC1-7):H01L27/04 |
主分类号 |
H01L27/04 |
代理机构 |
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主权项 |
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地址 |
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