发明名称 METHOD FOR FABRICATING SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a semiconductor device is provided to stabilize a capacitor mask process by forming a photo-resist layer pattern on a wafer edge portion and performing the capacitor mask process. CONSTITUTION: An interlayer dielectric(10) is formed on a semiconductor substrate(1). A contact hole is formed on the semiconductor substrate(1). A contact plug(16) is formed by using a polysilicon or a selective-W. A core oxide layer(20) is formed on a whole surface of the above structure. The first photo-resist layer(34) is formed on the core oxide layer(20). The first photo-resist layer(34) is exposed selectively by using an anti-capacitor mask. The first photo-resist layer pattern(34) is formed by developing the first photo-resist layer(34). The second photo-resist layer(38) is applied on the whole surface. A charge storage electrode hole is formed by etching the exposed core oxide layer(20).
申请公布号 KR20020058278(A) 申请公布日期 2002.07.12
申请号 KR20000086340 申请日期 2000.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, CHAN SEOP;CHOI, SANG TAE;KO, BONG SANG;KWON, WON TAEK;SHIN, GI SU;YOON, TAE BONG
分类号 H01L27/04;(IPC1-7):H01L27/04 主分类号 H01L27/04
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