发明名称 HIGH-TEMPERATURE ELECTRODE AND BARRIER STRUCTURE USED FOR FRAM AND DRAM
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor structure capable of enduring an annealing at a high temperature without damaging conductivity and perfection. SOLUTION: The semiconductor structure includes a substrate selected among substrates of a group of silicon, polysilicon, silicon dioxide, and silicon germanium, and an electrode located on the substrate. The electrode contains a layer of a composition of Ir-M-O. Where, M is a metal selected from among metals of a group of Ta, Ti, Nb, Al, Hf, Zr, and V. The semiconductor structure is constructed and arranged so as to endure the annealing at a temperature of 600 deg.C or more without damaging conductivity and perfection.
申请公布号 JP2002198324(A) 申请公布日期 2002.07.12
申请号 JP20010339963 申请日期 2001.11.05
申请人 SHARP CORP 发明人 ZHANG FENGYAN;SHIEN TEN SUU;HON IN
分类号 H01L21/28;H01L21/02;H01L21/283;H01L21/3205;H01L21/8242;H01L21/8246;H01L27/10;H01L27/105;H01L27/108;H01L29/49 主分类号 H01L21/28
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