发明名称 SERIAL PATH TESTER
摘要 PROBLEM TO BE SOLVED: To provide a serial path tester which can monitor the transmission condition of a serial path for a long time with a simple configuration. SOLUTION: A physical layer circuit 5n of a serial path tester 2n, which receives packet transmission signals from other node devices through a high- speed serial path 1 of IEEE(Institute of Electrical and Electronics Engineers) 1394, outputs the received data along with control signals for handshake, and a data extraction circuit 27 connected to the physical layer circuit 5n extracts data of one byte configuring a packet and detects the byte location in the packet of the byte data. A CRC(circular redundancy check) error judgment circuit 28 judges presence/absence of a header CRC error and presence/absence of a data CRC error, according to the extracted byte data and byte location, and a header CRC error counter 29 measures the number of header CRC error occurrence, and a data CRC error counter 30 measures the number of data CRC error occurrence.
申请公布号 JP2002198976(A) 申请公布日期 2002.07.12
申请号 JP20000397967 申请日期 2000.12.27
申请人 KENWOOD TMI:KK;KENWOOD CORP 发明人 SHINOZUKA SATORU;KASAHARA MASAYA
分类号 G06F13/38;G06F13/00;H04L12/28;H04L12/40;H04L29/14;(IPC1-7):H04L12/40 主分类号 G06F13/38
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