发明名称 |
PROTECTIVE CIRCUIT OF MOSFET |
摘要 |
PROBLEM TO BE SOLVED: To protect the gate oxide film of an MOSFET against breakdown due to overvoltage. SOLUTION: Gate electrodes of a post-stage MOSFETs are connected with the connected drain electrodes of prestage MOSFETs, drain electrodes of the post-stage MOSFETs are connected together, a substrate diode formed on a semiconductor substrate between the prestage drain region and source region is connected between the gate electrode and source electrode of the post-stage MOSFET thus making the breakdown voltage of the substrate diode not higher than a level where the gate oxide film is broken by a voltage being applied between the gate electrode and source electrode of the post-stage MOSFET.
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申请公布号 |
JP2002198440(A) |
申请公布日期 |
2002.07.12 |
申请号 |
JP20000397798 |
申请日期 |
2000.12.27 |
申请人 |
SANYO ELECTRIC CO LTD |
发明人 |
BANDAI TADAO;ARIYAMA SHO;TSUCHIDA MITSUHO;ETO HIROKI |
分类号 |
H01L27/04;H01L21/822;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 |
主分类号 |
H01L27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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