发明名称 PROTECTIVE CIRCUIT OF MOSFET
摘要 PROBLEM TO BE SOLVED: To protect the gate oxide film of an MOSFET against breakdown due to overvoltage. SOLUTION: Gate electrodes of a post-stage MOSFETs are connected with the connected drain electrodes of prestage MOSFETs, drain electrodes of the post-stage MOSFETs are connected together, a substrate diode formed on a semiconductor substrate between the prestage drain region and source region is connected between the gate electrode and source electrode of the post-stage MOSFET thus making the breakdown voltage of the substrate diode not higher than a level where the gate oxide film is broken by a voltage being applied between the gate electrode and source electrode of the post-stage MOSFET.
申请公布号 JP2002198440(A) 申请公布日期 2002.07.12
申请号 JP20000397798 申请日期 2000.12.27
申请人 SANYO ELECTRIC CO LTD 发明人 BANDAI TADAO;ARIYAMA SHO;TSUCHIDA MITSUHO;ETO HIROKI
分类号 H01L27/04;H01L21/822;H01L21/8238;H01L27/092;(IPC1-7):H01L21/823 主分类号 H01L27/04
代理机构 代理人
主权项
地址