发明名称 |
IMAGE SENSOR FOR IMPROVING CHARACTERISTIC OF LIGHT SENSITIVITY AND METHOD FOR FABRICATING THE SAME |
摘要 |
PURPOSE: An image sensor for improving a characteristic of light sensitivity and a method for fabricating the same are provided to improve the light sensitivity by reducing an overlapped capacitance between a gate electrode and a floating diffusion region. CONSTITUTION: A field oxide layer(31) is formed on a p-type semiconductor substrate(30). A gate insulating layer(32) is formed on the p-type semiconductor substrate(30). A gate electrode(33) of a transfer transistor is formed on the gate insulating layer(32). An n-type dopant region(34) is formed by implanting n-type dopants ions into the semiconductor substrate(30) of one end portion of the gate electrode(33). An insulating layer spacer(35) is formed on a sidewall of the gate electrode(33). A p-type dopant region(37) is formed on the n-type dopant region(34). A floating diffusion region(38) is formed on the silicon substrate(30) of the other end portion of the gate electrode(33).
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申请公布号 |
KR20020058420(A) |
申请公布日期 |
2002.07.12 |
申请号 |
KR20000086525 |
申请日期 |
2000.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
HWANG, JUN |
分类号 |
H01L27/146;(IPC1-7):H01L27/146 |
主分类号 |
H01L27/146 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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