发明名称 IMAGE SENSOR FOR IMPROVING CHARACTERISTIC OF LIGHT SENSITIVITY AND METHOD FOR FABRICATING THE SAME
摘要 PURPOSE: An image sensor for improving a characteristic of light sensitivity and a method for fabricating the same are provided to improve the light sensitivity by reducing an overlapped capacitance between a gate electrode and a floating diffusion region. CONSTITUTION: A field oxide layer(31) is formed on a p-type semiconductor substrate(30). A gate insulating layer(32) is formed on the p-type semiconductor substrate(30). A gate electrode(33) of a transfer transistor is formed on the gate insulating layer(32). An n-type dopant region(34) is formed by implanting n-type dopants ions into the semiconductor substrate(30) of one end portion of the gate electrode(33). An insulating layer spacer(35) is formed on a sidewall of the gate electrode(33). A p-type dopant region(37) is formed on the n-type dopant region(34). A floating diffusion region(38) is formed on the silicon substrate(30) of the other end portion of the gate electrode(33).
申请公布号 KR20020058420(A) 申请公布日期 2002.07.12
申请号 KR20000086525 申请日期 2000.12.30
申请人 HYNIX SEMICONDUCTOR INC. 发明人 HWANG, JUN
分类号 H01L27/146;(IPC1-7):H01L27/146 主分类号 H01L27/146
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