| 摘要 |
PROBLEM TO BE SOLVED: To realize a redundant circuit in which continuous address replacing can be performed. SOLUTION: A semiconductor memory has a redundant circuit consisting of a fuse section 1 storing a defective address and a decoding section 2 detecting coincidence of a stored defective address and an address externally given in actual operation, continuous addresses are replaced by redundant circuits of one set by storing an address stored in the redundant circuit of one set and an address to which 1 is added when all low order addresses are '1' in the fuse section 1.
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