发明名称 |
METHOD FOR FORMING METAL DAMASCENE GATE |
摘要 |
PURPOSE: A method for forming a metal damascene gate is provided to prevent the damage of a dummy polysilicon by CMP(Chemical Mechanical Polishing) using a CeO slurry. CONSTITUTION: After forming a gate oxide(2) on a silicon substrate(1), a dummy polysilicon gate(3) is formed on the gate oxide(2). Source and drain regions(5) are formed in the silicon substrate. Spacers(4) are formed at both sidewalls of the dummy polysilicon gate(3). After depositing an interlayer dielectric(6) on the resultant structure, the surface of the dummy polysilicon gate(3) is exposed by CMP using CeO slurry having high polishing selectivity against the polysilicon. A silicon-contained oxide formed on the dummy polysilicon gate(3) is then removed by wet-etching.
|
申请公布号 |
KR20020058508(A) |
申请公布日期 |
2002.07.12 |
申请号 |
KR20000086617 |
申请日期 |
2000.12.30 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JANG, SE EOK;KIM, HYEONG HWAN;KIM, TAE GYUN;LEE, SANG IK |
分类号 |
H01L21/336;(IPC1-7):H01L21/336 |
主分类号 |
H01L21/336 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|