发明名称 |
METHOD FOR FABRICATING CAPACITOR LOWER ELECTRODE OF SEMICONDUCTOR MEMORY DEVICE |
摘要 |
PURPOSE: A method for fabricating a capacitor lower electrode of a semiconductor memory device is provided to prevent a bridge between lower electrodes by removing an apex of a conductive layer. CONSTITUTION: An interlayer dielectric(100) is formed on a surface of a semiconductor substrate. A contact hole is formed on the interlayer dielectric(100). A doped polysilicon is buried therein. A contact plug(110) is formed by performing a chemical mechanical polishing process. A sacrificial insulating layer(112) is formed on a whole surface of the substrate. An aperture is formed on the sacrificial insulating layer(112). A polysilicon as a conductive layer is formed on the sacrificial insulating layer(112) having the aperture. A gap-fill layer is formed on the conductive layer. The gap-fill layer and the conductive layer are polished. An apex of the conductive layer is removed by performing an H2 annealing process. A concavo-convex portion(122) is formed on the conductive layer by performing a selective MPS(Meta-Stable Polysilicon) process and a lower electrode(120a) is formed thereon.
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申请公布号 |
KR20020058367(A) |
申请公布日期 |
2002.07.12 |
申请号 |
KR20000086435 |
申请日期 |
2000.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
JANG, MIN SIK;KI, YEONG JONG |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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