发明名称 METHOD FOR SELECTIVELY ETCHING SILICON USING WET ETCH
摘要 PURPOSE: A selective etch method of silicon is provided to perform a wet etch having a good etch selectivity between a doped silicon thin film and an undoped silicon thin film. CONSTITUTION: An undoped silicon thin film(22) and a doped silicon thin film(23) are stacked on a defined process completed structure(21). Then, a mask pattern(24) is formed by selectively etching a photoresist or a metal having a wet etch selectivity with a polysilicon. Then, the doped silicon thin film(23) is selectively removed by a wet etching using the mask pattern(24). At this time, the wet etching is performed using a mixed solution made of HF, a nitric acid and an acetic acid or another mixed solution made of the HF, the nit acid and water. The mixed solution oxidizes a silicon thin film using the nitric acid and simultaneously etches an oxide using the HF.
申请公布号 KR20020058450(A) 申请公布日期 2002.07.12
申请号 KR20000086556 申请日期 2000.12.30
申请人 ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE 发明人 CHO, GYEONG IK;HWANG, CHI SEON;KIM, DO HYEONG;LEE, JIN HO;SONG, YUN HO
分类号 H01L21/3063;(IPC1-7):H01L21/306 主分类号 H01L21/3063
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