发明名称 |
METHOD FOR SELECTIVELY ETCHING SILICON USING WET ETCH |
摘要 |
PURPOSE: A selective etch method of silicon is provided to perform a wet etch having a good etch selectivity between a doped silicon thin film and an undoped silicon thin film. CONSTITUTION: An undoped silicon thin film(22) and a doped silicon thin film(23) are stacked on a defined process completed structure(21). Then, a mask pattern(24) is formed by selectively etching a photoresist or a metal having a wet etch selectivity with a polysilicon. Then, the doped silicon thin film(23) is selectively removed by a wet etching using the mask pattern(24). At this time, the wet etching is performed using a mixed solution made of HF, a nitric acid and an acetic acid or another mixed solution made of the HF, the nit acid and water. The mixed solution oxidizes a silicon thin film using the nitric acid and simultaneously etches an oxide using the HF.
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申请公布号 |
KR20020058450(A) |
申请公布日期 |
2002.07.12 |
申请号 |
KR20000086556 |
申请日期 |
2000.12.30 |
申请人 |
ELECTRONICS AND TELECOMMUNICATIONS RESEARCH INSTITUTE |
发明人 |
CHO, GYEONG IK;HWANG, CHI SEON;KIM, DO HYEONG;LEE, JIN HO;SONG, YUN HO |
分类号 |
H01L21/3063;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/3063 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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