发明名称 DESIGN RULE CHECKING METHOD OF HIERARCHICAL LAYOUT PATTERN
摘要 PROBLEM TO BE SOLVED: To reduce TAT for verifying the layout by eliminating the redundant error graphic and eliminating the error graphic. SOLUTION: This design checking method has a flow A2 as a flow of the total processing of a layout verifying tool, a DRC flow B2 composing the flow A2 as the total processing of the DRC processing, and including an additional information adding step B27 and an error graphic compressing step C1, an error graphic outputting flow D1 composing the flow A2 as the total processing for outputting the error graphic, and an error compression flow C1 as the error compressing processing for compressing the error graphic to be outputted, by eliminating the redundant error graphic.
申请公布号 JP2002197134(A) 申请公布日期 2002.07.12
申请号 JP20000396760 申请日期 2000.12.27
申请人 NEC MICROSYSTEMS LTD 发明人 TSURUMOTO TAKETOSHI
分类号 G06F17/50;H01L21/82;(IPC1-7):G06F17/50 主分类号 G06F17/50
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