| 摘要 |
A spectrometer (1) for reflection measurement contains a rotatable mirror arrangement (5) which is movable about an optical axis (21) between at least one measuring location (12) and a reference position (10), so that the measuring and reference conditions are largely identical. The rotatable mirror arrangement (5) and the reference sample(s) are arranged in a closed housing (13). The measuring samples (11) are placed on a receiving location (15) on the outer wall (14) of the housing (13). The spectrometer (1) with a rotatable mirror arrangement (5) may be applied for multiple referencing.
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