发明名称 Thin-film circuit substrate and method of producing same
摘要 A surface modification layer having a surface modification coefficient of 0.1 to 0.5 is formed on the surface of an organic insulating film on a substrate. A metal wiring is provided on the surface of the organic insulating film having the surface modification layer formed at the surface thereof. Thus, the bonding strength between the metal wiring and the organic insulating film is enhanced. The surface modification coefficient is the ratio of C atoms constituting functional groups, and is a value obtained by calculation according to the following formula.<paragraph lvl="0"><in-line-formula>surface modification coefficient=the total number of functional groups/the total number of C atoms present at the surface of an organic insulating film.</in-line-formula>
申请公布号 US2002090831(A1) 申请公布日期 2002.07.11
申请号 US20010973530 申请日期 2001.10.09
申请人 MURATA MANUFACTURING CO., LTD. 发明人 YOSHIDA KOJI;TOSE MAKOTO
分类号 B32B7/02;B32B15/08;H01L21/312;H01L21/48;H01L21/768;H01L23/498;H01L23/522;H05K3/38;(IPC1-7):H01L23/58;H01L21/31;H01L21/469;H01L23/48;H01L23/52;H01L29/40 主分类号 B32B7/02
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