发明名称 METHOD OF PROCESSING RESIDUE OF ION IMPLANTED PHOTORESIST, AND METHOD OF PRODUCING SEMICONDUCTOR DEVICE
摘要 In order to carry out ashing at a high efficiency without leaving any residue and also to inhibit corrosion of an underlying material of a resist and further to prevent particle contamination, a photoresist is ashed at a low temperature to be removed and a residue of the photoresist is removed at a high temperature.
申请公布号 US2002090827(A1) 申请公布日期 2002.07.11
申请号 US20000491876 申请日期 2000.01.27
申请人 YOKOSHIMA SHIGENOBU 发明人 YOKOSHIMA SHIGENOBU
分类号 G03F7/42;H01L21/311;(IPC1-7):H01L21/425;H01L21/302;H01L21/461 主分类号 G03F7/42
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