发明名称 Method of manufacturing semiconductor device having passivation film and buffer coating film
摘要 An interconnection is formed on a semiconductor substrate having a semiconductor element formed thereon. Next, a passivation film is formed on the semiconductor substrate including the interconnection. Further, a polyimide film, which is served as a buffer coating film, is formed on the passivation film. Further, the polyimide film is patterned. Next, the passivation film is subject to etching while the patterned polyimide film is taken as a mask. Next, a hardened layer, which is formed on the surface of the polyimide film as a result of etching, is removed through ashing process. Next, the semiconductor substrate after ashing process is cured so as to transform the polyimide film into imide.
申请公布号 US2002090809(A1) 申请公布日期 2002.07.11
申请号 US20010910824 申请日期 2001.07.24
申请人 MITSUBISHI DENKI KABUSHIKI KAISHA 发明人 TOBIMATSU HIROSHI;KAMIURA YUUKI;OKURA SEIJI;SAWADA MAHITO
分类号 G03F7/038;G03F7/40;H01L21/027;H01L21/302;H01L21/312;H01L21/44;H01L21/461;H01L21/4763;H01L21/56;H01L21/60;H01L21/768;(IPC1-7):H01L21/476 主分类号 G03F7/038
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