发明名称 |
CIRCUIT FOR CORRECTING I/Q SIGNAL ERROR WITH I/Q NOISE TEST SIGNAL AND METHOD OF THE SAME |
摘要 |
PURPOSE: A circuit for correcting I/Q signal error with I/Q noise test signal and a method of the same are provided to correct an error of an I/Q channel signal to improve a performance of system by calculating a coefficient from a system noise sample. CONSTITUTION: A first process calculates a distorted I/Q output sample from a test noise. A second process calculates a statistical I/Q signal parameter from an independent test sample. A third process calculates a statistical value of an I/Q signal component in a test noise signal. A fourth process calculates an error correction coefficient from the statistical value of the I/Q signal component to calculate an I/Q channel error parameter. A fifth process outputs an error-corrected I/Q channel signal through an operation of the I/Q channel error parameter.
|
申请公布号 |
KR20020056984(A) |
申请公布日期 |
2002.07.11 |
申请号 |
KR20000087208 |
申请日期 |
2000.12.30 |
申请人 |
SAMSUNG THALES CO., LTD. |
发明人 |
SONG, YEONG IK |
分类号 |
H04L27/227;(IPC1-7):H04L27/227 |
主分类号 |
H04L27/227 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|