发明名称 CIRCUIT FOR CORRECTING I/Q SIGNAL ERROR WITH I/Q NOISE TEST SIGNAL AND METHOD OF THE SAME
摘要 PURPOSE: A circuit for correcting I/Q signal error with I/Q noise test signal and a method of the same are provided to correct an error of an I/Q channel signal to improve a performance of system by calculating a coefficient from a system noise sample. CONSTITUTION: A first process calculates a distorted I/Q output sample from a test noise. A second process calculates a statistical I/Q signal parameter from an independent test sample. A third process calculates a statistical value of an I/Q signal component in a test noise signal. A fourth process calculates an error correction coefficient from the statistical value of the I/Q signal component to calculate an I/Q channel error parameter. A fifth process outputs an error-corrected I/Q channel signal through an operation of the I/Q channel error parameter.
申请公布号 KR20020056984(A) 申请公布日期 2002.07.11
申请号 KR20000087208 申请日期 2000.12.30
申请人 SAMSUNG THALES CO., LTD. 发明人 SONG, YEONG IK
分类号 H04L27/227;(IPC1-7):H04L27/227 主分类号 H04L27/227
代理机构 代理人
主权项
地址