An interface device (2) provides an interface between testing equipment and an integrated circuit to be tested. The interface device (2) includes a body member (7). A number of elongate contact members (5) are mounted on the body member (7). Each contact member (5) includes a contact end (10), adapted to contact a bond pad of the integrated circuit to be tested, and a body portion (11). The interface device also includes a guide member mounted on the body member (7). The guide member includes a substantially planar member having a number of apertures therein, and the contact end of each elongate member extending through a respective aperture in the guide member.
