发明名称 |
Modular high parallelism interface for integrated circuit testing, method of assembly, and use of same |
摘要 |
A high density connector that connects devices under test and a test head that includes coaxial cable connectors on a first end, and connection points located on a male connector portion at a second end, with a waveguide member connecting respective cable connectors and connection points to create a communication pathway having an isolated ground and a 1:1 signal-to-ground ratio. The connector is a PCB, with the waveguides being in a ground-signal-ground configuration with a signal distance between adjacent waveguides being 0.2 inches or less. The coaxial cable connections are modular, allowing cables from the devices under test to be plugged without soldering. This non-solder connection also allows the cables to be unplugged and replugged as necessary. The male connector portion is connected to a female low insertion force connector on the test head in order to complete the connection between the devices under test and the test head.
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申请公布号 |
US2002089322(A1) |
申请公布日期 |
2002.07.11 |
申请号 |
US20010757526 |
申请日期 |
2001.01.11 |
申请人 |
FRAME JAMES WARREN;JONES MARK R. |
发明人 |
FRAME JAMES WARREN;JONES MARK R. |
分类号 |
G01R1/04;(IPC1-7):G01R1/00 |
主分类号 |
G01R1/04 |
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