发明名称 Modular high parallelism interface for integrated circuit testing, method of assembly, and use of same
摘要 A high density connector that connects devices under test and a test head that includes coaxial cable connectors on a first end, and connection points located on a male connector portion at a second end, with a waveguide member connecting respective cable connectors and connection points to create a communication pathway having an isolated ground and a 1:1 signal-to-ground ratio. The connector is a PCB, with the waveguides being in a ground-signal-ground configuration with a signal distance between adjacent waveguides being 0.2 inches or less. The coaxial cable connections are modular, allowing cables from the devices under test to be plugged without soldering. This non-solder connection also allows the cables to be unplugged and replugged as necessary. The male connector portion is connected to a female low insertion force connector on the test head in order to complete the connection between the devices under test and the test head.
申请公布号 US2002089322(A1) 申请公布日期 2002.07.11
申请号 US20010757526 申请日期 2001.01.11
申请人 FRAME JAMES WARREN;JONES MARK R. 发明人 FRAME JAMES WARREN;JONES MARK R.
分类号 G01R1/04;(IPC1-7):G01R1/00 主分类号 G01R1/04
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