发明名称 ELECTRODE STRUCTURE OF SCHOTTKY BARRIER DIODE
摘要 <p>PROBLEM TO BE SOLVED: To provide an electrode structure of a Schottky barrier diode which can minimize a stress caused by a solder in order to eliminate an undesirable influence upon the reverse direction characteristic of the Schottky barrier diode when a semiconductor chip is bonded to an anode-side electrode of a lead frame. SOLUTION: This electrode structure of a Schottky barrier diode is composed of a bonded metal electrode consisting of a metal which is easy to fit for a solder, an intermediate metal electrode, and a Schottky metal electrode consisting of a metal which is hard to fit for a solder. The sizes of the bonded metal electrode and the intermediate metal electrode are determined to be smaller than the Schottky metal electrode. Furthermore, being the same size as the Schottky metal electrode, an overhang part out of a diffusion region of a guard ring is at least 30μm.</p>
申请公布号 JP2002158363(A) 申请公布日期 2002.05.31
申请号 JP20000350978 申请日期 2000.11.17
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YAMAZAWA SHIRO;KIMURA JUNICHI
分类号 H01L29/47;H01L29/872;(IPC1-7):H01L29/872 主分类号 H01L29/47
代理机构 代理人
主权项
地址