| 摘要 |
PROBLEM TO BE SOLVED: To realize an IC tester capable of specifying setting data for every group per pin unit. SOLUTION: In this IC tester performing a test on a tested object by means of a unit per pin arranged for every pin as the tested object, the unit per pin is provided with a setting register designated by a register address and holding the setting data defining a test condition, a conformity detector detecting conformity of a unit address, a group detector detecting conformity of a group address by using the unit address as the group address, and a writing part writing the setting data in the setting register according to a conformity signal from the conformity detector when a broadcast signal is not inputted and writing the setting data in the setting register according to a conformity signal of a group designating memory when the broadcast signal is inputted.
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