发明名称 METHOD FOR DETECTING LEAKAGE CURRENT
摘要 PURPOSE: A detection method of a leakage current is provided to reduce manufacturing costs and test costs by connecting pins used in test mode with the other pins not used in test mode through pass gates. CONSTITUTION: A first, and a fifth data pins(1,5) are used in test mode. Then, a second, a third, and a fourth data pins(2,3,4) are connected with the first data pin(1) by respectively using a first, a second, and a third(T1,T2,T3) for connecting between the outputs of the first and second data pins(1,2), the outputs of the second and third data pins(2,3), and the outputs of the third and fourth data pins(3,4). At the same time, a sixth, a seventh, and an eighth data pins(6,7,8) are connected with the fifth data pin(5) by respectively using a fourth, a fifth, and a sixth(T4,T5,T6) for connecting between the outputs of the fifth and sixth data pins(5,6), the outputs of the sixth and seventh data pins(6,7), and the outputs of the seventh and eighth data pins(7,8).
申请公布号 KR20020055921(A) 申请公布日期 2002.07.10
申请号 KR20000085179 申请日期 2000.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, JU HWAN
分类号 G01R31/02;G11C29/00;(IPC1-7):G01R31/26 主分类号 G01R31/02
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