发明名称 |
METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE |
摘要 |
PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to improve reliability, by controlling redeposition of Pt on the side surface of an oxide layer in forming a Pt storage electrode such that the Pt is an electrochemical deposition(ECD) seed metal under the oxide layer, and to guarantee sufficient capacitance by controlling generation of a fence. CONSTITUTION: A lower conductive element is formed. An etch barrier/adhesion layer is formed on the lower conductive element. An oxide layer for forming an electrode pattern is formed on the entire surface including the etch barrier/adhesion layer. The oxide layer is etched while etch selectivity of the lower conductive element and the etch barrier/adhesion layer is maintained at a ratio of 10:1. The oxide layer patterned by the etch process is cleaned.
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申请公布号 |
KR20020056635(A) |
申请公布日期 |
2002.07.10 |
申请号 |
KR20000086036 |
申请日期 |
2000.12.29 |
申请人 |
HYNIX SEMICONDUCTOR INC. |
发明人 |
CHO, YUN SEOK;PARK, CHANG HEON |
分类号 |
H01L21/8242;(IPC1-7):H01L21/824 |
主分类号 |
H01L21/8242 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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