发明名称 METHOD FOR FABRICATING CAPACITOR OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for fabricating a capacitor of a semiconductor device is provided to improve reliability, by controlling redeposition of Pt on the side surface of an oxide layer in forming a Pt storage electrode such that the Pt is an electrochemical deposition(ECD) seed metal under the oxide layer, and to guarantee sufficient capacitance by controlling generation of a fence. CONSTITUTION: A lower conductive element is formed. An etch barrier/adhesion layer is formed on the lower conductive element. An oxide layer for forming an electrode pattern is formed on the entire surface including the etch barrier/adhesion layer. The oxide layer is etched while etch selectivity of the lower conductive element and the etch barrier/adhesion layer is maintained at a ratio of 10:1. The oxide layer patterned by the etch process is cleaned.
申请公布号 KR20020056635(A) 申请公布日期 2002.07.10
申请号 KR20000086036 申请日期 2000.12.29
申请人 HYNIX SEMICONDUCTOR INC. 发明人 CHO, YUN SEOK;PARK, CHANG HEON
分类号 H01L21/8242;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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