发明名称 Method of fabricating a bottom electrode
摘要 A method of fabricating a bottom electrode is described. A substrate having a conductive layer therein is provided. A first dielectric layer is formed over the substrate. A conductive plug is formed through the first dielectric layer to electrically couple with the conductive layer. A cap layer is formed over the substrate to cover the conductive plug. An isolation layer is formed over the cap layer. A plurality of bit lines is formed over the isolation layer. A second dielectric layer is formed over the isolation layer. A node contact opening is formed through the second dielectric layer, the bit lines and the isolation layer to expose the cap layer. A conformal isolation layer is formed over the substrate to partially fill the contact node opening. A third dielectric layer having an opening is formed over the substrate. The opening is aligned with the node contact opening. An etching step is performed to remove a portion of the conformal isolation layer exposed by the opening and the cap layer. An isolation spacer remaining from the conformal isolation layer is formed on a sidewall of the contact node opening. A conformal conductive layer is formed in the opening and the node contact opening to make contact with the conductive plug. The third dielectric layer is removed.
申请公布号 US6417065(B1) 申请公布日期 2002.07.09
申请号 US20000718190 申请日期 2000.11.20
申请人 UNITED MICROELECTRONICS CORP. 发明人 WU KING-LUNG;LIN KUN-CHI
分类号 H01L21/02;H01L21/60;H01L21/768;H01L21/8242;(IPC1-7):H01L21/824;H01L21/20;H01L21/320 主分类号 H01L21/02
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