发明名称 |
Method for treating the surface of a deep trench |
摘要 |
A method of treating the surface of a deep trench is disclosed. After forming a deep trench in a silicon substrate, the silicon substrate near the surfaces of the deep trench is treated to become amorphous. An annealing process is executed to make the amorphous silicon layer recrystallize into its original lattice arrangement, so as to reduce lattice defects in the surface of the deep trench.
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申请公布号 |
US6417064(B1) |
申请公布日期 |
2002.07.09 |
申请号 |
US20010846302 |
申请日期 |
2001.05.02 |
申请人 |
NANYA TECHNOLOGY CORPORATION |
发明人 |
LIN SHIAN-JYH;HUNG HAI-HAN |
分类号 |
H01L21/20;H01L21/265;H01L21/8242;(IPC1-7):H01L21/20 |
主分类号 |
H01L21/20 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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