发明名称 Semiconductor wafer with sensors for detecting radiation on the semiconductor wafer
摘要 A semiconductor wafer includes a plurality of sensors. Each of the sensors has a field oxide transistor, and a detecting circuit electrically connected to the field oxide transistor for detecting if the field oxide transistor is switched on or off and generating corresponding detecting signals. The field oxide of a different field oxide transistor has a different thickness. Each field oxide transistor is coupled to a corresponding detecting circuit for detecting radiation impinging on the semiconductor wafer.
申请公布号 US6417553(B1) 申请公布日期 2002.07.09
申请号 US20010682482 申请日期 2001.09.07
申请人 AMIC TECHNOLOGY (TAIWAN) INC. 发明人 CHOU KUO-YU;CHIANG CHIEN-SHAN;HO LO-CHUN;HSU CHIH-HSUEH
分类号 H01L27/144;H01L31/113;(IPC1-7):H01L31/04 主分类号 H01L27/144
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