发明名称 |
Semiconductor wafer with sensors for detecting radiation on the semiconductor wafer |
摘要 |
A semiconductor wafer includes a plurality of sensors. Each of the sensors has a field oxide transistor, and a detecting circuit electrically connected to the field oxide transistor for detecting if the field oxide transistor is switched on or off and generating corresponding detecting signals. The field oxide of a different field oxide transistor has a different thickness. Each field oxide transistor is coupled to a corresponding detecting circuit for detecting radiation impinging on the semiconductor wafer.
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申请公布号 |
US6417553(B1) |
申请公布日期 |
2002.07.09 |
申请号 |
US20010682482 |
申请日期 |
2001.09.07 |
申请人 |
AMIC TECHNOLOGY (TAIWAN) INC. |
发明人 |
CHOU KUO-YU;CHIANG CHIEN-SHAN;HO LO-CHUN;HSU CHIH-HSUEH |
分类号 |
H01L27/144;H01L31/113;(IPC1-7):H01L31/04 |
主分类号 |
H01L27/144 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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